A method for production of cheap, reliable Pt--Ir tips

by: BL Rogers, JG Shapter, WM Skinner, K Gascoigne

Review of Scientific Instruments, Vol. 71, No. 4. (2000), pp. 1702-1705.

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Abstract

A new method of producing Pt–Ir tips for use in scanning tunneling microscopy is described. This reproducible method is simple, cheap, fast, and avoids the use of hazardous chemicals common in many other methods. Scanning electron microscopy, time of flight–secondary ion mass spectroscopy, and x-ray photoelectron spectroscopy have been applied to understand both the chemical and morphological changes that occur as a result of the etching. The method has been demonstrated on both stock Pt–Ir wire and commercial tips and has been found to dramatically enhance image quality. It is also reusable on the same tip extending the lifetime of a single tip indefinitely. ©2000 American Institute of Physics.

@article{citeulike:1357964, abstract = {A new method of producing Pt\&\#150;Ir tips for use in scanning tunneling microscopy is described. This reproducible method is simple, cheap, fast, and avoids the use of hazardous chemicals common in many other methods. Scanning electron microscopy, time of flight\&\#150;secondary ion mass spectroscopy, and x-ray photoelectron spectroscopy have been applied to understand both the chemical and morphological changes that occur as a result of the etching. The method has been demonstrated on both stock Pt\&\#150;Ir wire and commercial tips and has been found to dramatically enhance image quality. It is also reusable on the same tip extending the lifetime of a single tip indefinitely. \©2000 American Institute of Physics.}, author = {Rogers, B. L. and Shapter, J. G. and Skinner, W. M. and Gascoigne, K. }, citeulike-article-id = {1357964}, doi = {10.1063/1.1150523}, journal = {Review of Scientific Instruments}, keywords = {stm\_tip\_prep}, number = {4}, pages = {1702--1705}, posted-at = {2007-06-02 18:30:46}, priority = {3}, publisher = {AIP}, title = {A method for production of cheap, reliable Pt--Ir tips}, url = {http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal\&id=RSINAK000071000004001702000001\&idtype=cvips\&gifs=yes}, volume = {71}, year = {2000} }

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TY - JOUR ID - citeulike:1357964 L3 - citeulike-article-id:1357964 TI - A method for production of cheap, reliable Pt--Ir tips JF - Review of Scientific Instruments VL - 71 IS - 4 SP - 1702 EP - 1705 PB - AIP N2 - A new method of producing PtIr tips for use in scanning tunneling microscopy is described. This reproducible method is simple, cheap, fast, and avoids the use of hazardous chemicals common in many other methods. Scanning electron microscopy, time of flightsecondary ion mass spectroscopy, and x-ray photoelectron spectroscopy have been applied to understand both the chemical and morphological changes that occur as a result of the etching. The method has been demonstrated on both stock PtIr wire and commercial tips and has been found to dramatically enhance image quality. It is also reusable on the same tip extending the lifetime of a single tip indefinitely. ©2000 American Institute of Physics. KW - stm_tip_prep AU - Rogers, BL AU - Shapter, JG AU - Skinner, WM AU - Gascoigne, K PY - 2000/// UR - http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=RSINAK000071000004001702000001&idtype=cvips&gifs=yes ER -

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