Characterization of Metamaterial Interconnects

@inproceedings{citeulike:2674826, abstract = {In this paper, a metamaterial interconnect is investigated and evaluated through simulations and measurements. Short-pulse propagation technique is utilized to characterize the propagation constant of the metameterial transmission line. The extracted {\ss} is subsequently used in the design of a metamaterial backward coupler, which is compared with a conventional microstrip coupler experimentally. The metamaterial coupler demonstrates superior performance over its conventional microstrip counterpart.}, author = {Suntives, Asanee and Khajooeizadeh, Arash and Abhari, Ramesh }, booktitle = {Electrical Performance of Electronic Packaging, 2007 IEEE}, citeulike-article-id = {2674826}, doi = {10.1109/EPEP.2007.4387163}, journal = {Electrical Performance of Electronic Packaging, 2007 IEEE}, keywords = {metamaterial}, pages = {211--214}, posted-at = {2008-04-15 19:24:41}, priority = {2}, title = {Characterization of Metamaterial Interconnects}, url = {http://dx.doi.org/10.1109/EPEP.2007.4387163}, year = {2007} }

TY - CONF ID - citeulike:2674826 L3 - citeulike-article-id:2674826 TI - Characterization of Metamaterial Interconnects T2 - Electrical Performance of Electronic Packaging, 2007 IEEE JF - Electrical Performance of Electronic Packaging, 2007 IEEE SP - 211 EP - 214 N2 - In this paper, a metamaterial interconnect is investigated and evaluated through simulations and measurements. Short-pulse propagation technique is utilized to characterize the propagation constant of the metameterial transmission line. The extracted ß is subsequently used in the design of a metamaterial backward coupler, which is compared with a conventional microstrip coupler experimentally. The metamaterial coupler demonstrates superior performance over its conventional microstrip counterpart. KW - metamaterial AU - Suntives, Asanee AU - Khajooeizadeh, Arash AU - Abhari, Ramesh PY - 2007/// UR - http://dx.doi.org/10.1109/EPEP.2007.4387163 ER -