Optimum noise measure configurations for transistor negative resistance amplifiers

by: P Gardner, DK Paul

Microwave Theory and Techniques, IEEE Transactions on, Vol. 45, No. 5. (1997), pp. 580-586.

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Abstract

A new method, using the noise matrix approach, has been developed for determining the optimum reactive terminations for a transistor employed as a low-noise negative-resistance element in a reflection-mode amplifier. This new method corroborates the less efficient graphical method the authors reported earlier. It is established theoretically and demonstrated numerically that the optimum noise measure of a transistor used in a reflection-mode amplifier is independent of the choice of active terminal and is identical to the optimum noise measure of the same transistor when used in a conventional transmission-mode amplifier

@article{citeulike:2782026, abstract = {A new method, using the noise matrix approach, has been developed for determining the optimum reactive terminations for a transistor employed as a low-noise negative-resistance element in a reflection-mode amplifier. This new method corroborates the less efficient graphical method the authors reported earlier. It is established theoretically and demonstrated numerically that the optimum noise measure of a transistor used in a reflection-mode amplifier is independent of the choice of active terminal and is identical to the optimum noise measure of the same transistor when used in a conventional transmission-mode amplifier}, author = {Gardner, P. and Paul, D. K. }, booktitle = {Microwave Theory and Techniques, IEEE Transactions on}, citeulike-article-id = {2782026}, doi = {10.1109/22.575572}, journal = {Microwave Theory and Techniques, IEEE Transactions on}, keywords = {amplifier, measurement, noise}, number = {5}, pages = {580--586}, posted-at = {2008-05-10 00:51:53}, priority = {2}, title = {Optimum noise measure configurations for transistor negative resistance amplifiers}, url = {http://dx.doi.org/10.1109/22.575572}, volume = {45}, year = {1997} }

RIS record

TY - JOUR ID - citeulike:2782026 TI - Optimum noise measure configurations for transistor negative resistance amplifiers T2 - Microwave Theory and Techniques, IEEE Transactions on JF - Microwave Theory and Techniques, IEEE Transactions on VL - 45 IS - 5 SP - 580 EP - 586 N2 - A new method, using the noise matrix approach, has been developed for determining the optimum reactive terminations for a transistor employed as a low-noise negative-resistance element in a reflection-mode amplifier. This new method corroborates the less efficient graphical method the authors reported earlier. It is established theoretically and demonstrated numerically that the optimum noise measure of a transistor used in a reflection-mode amplifier is independent of the choice of active terminal and is identical to the optimum noise measure of the same transistor when used in a conventional transmission-mode amplifier KW - amplifier KW - measurement KW - noise AU - Gardner, P AU - Paul, DK PY - 1997/// UR - http://dx.doi.org/10.1109/22.575572 ER -

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