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hearoplanes library [242 articles]

Nye artikler sendt til hearoplanes bibliotek.
  • Cutting of multiwalled carbon nanotubes by a negative voltage tip of an atomic force microscope: A possible mechanism
    Physical Review B, Vol. 68, No. 11. (2003), 113406.
    by Dal-Hyun Kim, Ja-Yong Koo, Jong-Jean Kim
    posted to etching by hearoplane on 2008-07-16 17:01:52 as **
  • Crystallographic Etching of Few-Layer Graphene
    (24 Jun 2008)
    by Sujit S Datta, Douglas R Strachan, Samuel M Khamis, Charlie AT Johnson
    posted to no-tag by hearoplane on 2008-07-16 11:22:38 as **
  • Dynamic AFM using the FM technique with constant excitation amplitude
    Applied Surface Science, Vol. 188, No. 3-4. (28 March 2002), pp. 355-362.
    by B Gotsmann, H Fuchs
    posted to no-tag by hearoplane on 2008-07-14 16:39:00 as **
  • Height anomalies in tapping mode atomic force microscopy in air caused by adhesion
    Ultramicroscopy, Vol. 69, No. 2. (September 1997), pp. 117-127.
    by Van Noort, Kees O Van der Werf, Bart G De Grooth, Niek F Van Hulst, Jan Greve
    posted to height_errors by hearoplane on 2008-07-14 16:07:31 as **
  • Scanning probe acceleration microscopy (SPAM) in fluids: mapping mechanical properties of surfaces at the nanoscale.
    Proceedings of the National Academy of Sciences of the United States of America, Vol. 103, No. 13. (28 March 2006), pp. 4813-4818.
    posted to no-tag by hearoplane on 2008-07-03 17:23:56 as ** along with 2 people najhannoor bobturner
  • Sensitivity of vibration modes of atomic force microscope cantilevers in continuous surface contact
    Nanotechnology, Vol. 13, No. 4. (2002), pp. 510-514.
    by Win-Jin Chang
    posted to no-tag by hearoplane on 2008-07-03 17:14:28 as ** along with 1 person najhannoor
  • Towards local electromechanical probing of cellular and biomolecular systems in a liquid environment
    Nanotechnology, Vol. 18, No. 42. (2007), 424020.
    by Sergei V Kalinin, Brian J Rodriguez, Stephen Jesse, Katyayani Seal, Roger Proksch, Sophia Hohlbauch, Irene Revenko, Gary L Thompson, Alexey A Vertegel
    posted to no-tag by hearoplane on 2008-07-02 15:29:58 as ** along with 1 person najhannoor
  • Characterization of Microfabricated Probes for Combined Atomic Force and High-Resolution Scanning Electrochemical Microscopy
    Anal. Chem., Vol. 78, No. 15. (1 August 2006), pp. 5436-5442.
    by MR Gullo, PLTM Frederix, T Akiyama, A Engel, NF Derooij, U Staufer
    posted to no-tag by hearoplane on 2008-07-02 14:20:34 as ** along with 1 person najhannoor
  • Dual-Frequency Resonance-Tracking Atomic Force Microscopy
    (2 Aug 2007)
    posted to no-tag by hearoplane on 2008-07-02 13:29:54 as **
  • Feed-forward compensation of surface potential in atomic force microscopy
    Review of Scientific Instruments, Vol. 79, No. 6. (2008)
    by Dominik Ziegler, Nicola Naujoks, Andreas Stemmer
    posted to no-tag by hearoplane on 2008-07-01 16:50:27 as **
  • Enhanced sensitivity to force gradients by using higher flexural modes of the atomic force microscope cantilever
    Applied Physics A: Materials Science & Processing, Vol. 66, No. 0. (1 March 1998), pp. S361-S364.
    posted to no-tag by hearoplane on 2008-07-01 15:41:39 as ** along with 1 person najhannoor
  • Evaluation of the capacitive force between an atomic force microscopy tip and a metallic surface
    The European Physical Journal B - Condensed Matter and Complex Systems, Vol. 2, No. 1. (19 April 1998), pp. 5-10.
    posted to model_capacitive_forces by hearoplane on 2008-06-26 10:55:52 as ** along with 1 person najhannoor
  • Kelvin probe investigations of metal work functions and correlation to device performance of organic light-emitting devices
    Synthetic Metals, Vol. 111-112 (1 June 2000), pp. 295-297.
    by TA Beierlein, W Brütting, H Riel, EI Haskal, P Müller, W Rieß
    posted to work function cpd by hearoplane on 2008-06-19 14:35:18 as **
  • Temperature control device for single molecule measurements using the atomic force microscope
    Review of Scientific Instruments, Vol. 77, No. 6. (2006)
    by Yao Yang, Fan C Lin, Guoliang Yang
    posted to heater by hearoplane on 2008-06-05 15:37:23 as **
  • Investigations of local electrical surface characteristics by dynamical scanning force microscopy
    Fresenius' Journal of Analytical Chemistry, Vol. 365, No. 1. (1999), pp. 96-98.
    posted to no-tag by hearoplane on 2008-05-30 13:21:30 as ** along with 1 person najhannoor
  • Geometric artefact suppressed surface potential measurements
    Nanotechnology, Vol. 17, No. 15. (14 August 2006), pp. 3728-3733.
    posted to no-tag by hearoplane on 2008-05-30 13:19:05 as **
  • Energy Dissipation and Nanoscale Imaging in Tapping Mode AFM
    Fundamentals of Friction and Wear (2007), pp. 361-371.
    by Ricardo García, Nicolás F Martínez, Carlos J Gómez, Antonio García-Martín
    posted to no-tag by hearoplane on 2008-05-21 22:03:06 as **
  • Controlling bistability in tapping-mode atomic force microscopy using dual-frequency excitation
    Applied Physics Letters, Vol. 91, No. 9. (2007)
    by Phanikrishna Thota, Scott Maclaren, Harry Dankowicz
    posted to no-tag by hearoplane on 2008-05-21 17:41:00 as ** along with 1 person najhannoor
  • Direct measurement of tapping force with a cantilever deflection force sensor
    Ultramicroscopy, Vol. 100, No. 3-4. (August 2004), pp. 233-239.
    by Chanmin Su, Lin Huang, Kevin Kjoller
    posted to tm force by hearoplane on 2008-05-21 17:33:54 as **
  • Dynamic force spectroscopy using cantilever higher flexural modes
    Applied Physics Letters, Vol. 91, No. 9. (2007)
    by Yoshiaki Sugimoto, Seiji Innami, Masayuki Abe, óscar Custance, Seizo Morita
    posted to no-tag by hearoplane on 2008-05-21 17:23:54 as **
  • Dynamics of damped cantilevers
    Review of Scientific Instruments, Vol. 71, No. 7. (2000), pp. 2772-2775.
    by S Rast, C Wattinger, U Gysin, E Meyer
    posted to springconstant higher eigenmode by hearoplane on 2008-05-21 17:22:41 as **
  • Dual-Frequency Resonance-Tracking Atomic Force Microscopy
    (2 Aug 2007)
    posted to no-tag by hearoplane on 2008-05-06 18:44:16 as **
  • Dual frequency modulation with two cantilevers in series: a possible means to rapidly acquire tip–sample interaction force curves with dynamic AFM
    Measurement Science and Technology, Vol. 19, No. 5. (2008), 055502.
    by Santiago D Solares, Gaurav Chawla
    posted to pll by hearoplane on 2008-05-06 18:36:56 as ** along with 1 person najhannoor
  • Raman mapping of a single-layer to double-layer graphene transition
    The European Physical Journal - Special Topics, Vol. 148, No. 1. (2007), pp. 171-176.
    posted to raman graphene by hearoplane on 2008-05-02 20:37:10 as **
  • Multimodal analysis of force spectroscopy based on a transfer function study of micro-cantilevers
    Nanotechnology, Vol. 18, No. 18. (2007), 185504.
    by Rafael Vazquez, Javier F Rubio-Sierra, Robert W Stark
    posted to no-tag by hearoplane on 2008-05-02 18:21:58 as **
  • Raman imaging of doping domains in graphene on SiO[sub 2]
    Applied Physics Letters, Vol. 91, No. 24. (2007)
    posted to no-tag by hearoplane on 2008-05-02 12:15:43 as **
  • The environment of graphene probed by electrostatic force microscopy
    Applied Physics Letters, Vol. 92, No. 12. (2008)
  • Conservative and dissipative force imaging of switchable rotaxanes with frequency-modulation atomic force microscopy
    Physical Review B (Condensed Matter and Materials Physics), Vol. 72, No. 12. (2005)
    by Alan A Farrell, Takeshi Fukuma, Takayuki Uchihashi, Euan R Kay, Giovanni Bottari, David A Leigh, Hirofumi Yamada, Suzanne P Jarvis
    posted to no-tag by hearoplane on 2008-04-15 19:43:21 as **
  • Development of liquid-environment frequency modulation atomic force microscope with low noise deflection sensor for cantilevers of various dimensions
    Review of Scientific Instruments, Vol. 77, No. 4. (2006)
    by Takeshi Fukuma, Suzanne P Jarvis
    posted to no-tag by hearoplane on 2008-04-15 18:51:39 as ** along with 1 person najhannoor
  • The environment of graphene probed by electrostatic force microscopy
    (13 Mar 2008)
    posted to efm graphene by hearoplane on 2008-03-17 14:18:07 as **
  • Investigations concerning the work function of doped graphite
    Plasma Chemistry and Plasma Processing, Vol. 13, No. 2. (1 June 1993), pp. 223-235.
    posted to function graphene work by hearoplane on 2008-03-12 03:06:02 as **
  • Surface electric potential dynamic on graphite
    (19 Sep 2007)
    posted to no-tag by hearoplane on 2008-02-29 16:18:25 as **
  • Spatially Resolved Raman Spectroscopy of Single- and Few-Layer Graphene
    Nano Lett., Vol. 7, No. 2. (14 February 2007), pp. 238-242.
  • Hydrogen accumulation in graphite and etching of graphite on hydrogen desorption
    Journal of Materials Science, Vol. 42, No. 4. (15 February 2007), pp. 1169-1176.
    by Z Waqar
    posted to no-tag by hearoplane on 2008-02-19 09:51:18 as **
  • Quantitative electrostatic force measurement in AFM
    Applied Surface Science, Vol. 157, No. 4. (2 April 2000), pp. 280-284.
    by Steve Jeffery, Ahmet Oral, John B Pethica
    posted to electrostatic force by hearoplane on 2008-01-15 13:08:16 as **
  • Tapping mode atomic force microscopy using electrostatic force modulation
    Applied Physics Letters, Vol. 69, No. 19. (1996), pp. 2831-2833.
    by JW Hong, ZG Khim, AS Hou, Sang I Park
    posted to electrostatic tapping by hearoplane on 2008-01-15 12:50:23 as **
  • Controlled positive and negative surface charge injection and erasure in a GaAs/AlGaAs based microdevice by scanning probe microscopy
    Nanotechnology, Vol. 19, No. 4. (30 January 2008), pp. 45304-45310.
    by Valdre, , Moro, , Lee, Dohyun, Smith, , Farrer, , Ritchie, , Green,
    posted to no-tag by hearoplane on 2008-01-14 13:18:38 as **
  • Material scienceOxygen breaks into carbon world
    Nature, Vol. 441, No. 7095. (14 June 2006), pp. 818-819.
    by Pulickel M Ajayan, Boris I Yakobson
    posted to no-tag by hearoplane on 2008-01-14 13:06:24 as **
  • Tapping mode quartz crystal resonator based scanning force microscopy
    Review of Scientific Instruments, Vol. 76, No. 1. (2005)
    by Yongho Seo, Wonho Jhe
    posted to no-tag by hearoplane on 2008-01-13 14:30:11 as **
  • Selective self-assembly at room temperature of individual freestanding Ag[sub 2]Ga alloy nanoneedles
    Journal of Applied Physics, Vol. 98, No. 7. (2005)
    by Mehdi M Yazdanpanah, Steven A Harfenist, Abdelilah Safir, Robert W Cohn
    posted to kfm nanoneedles tips by hearoplane on 2007-12-11 15:49:08 as read
  • Charge writing on the nanometre scale in a fluorocarbon film
    Surface and Interface Analysis, Vol. 33, No. 2. (2002), pp. 159-162.
    by P Mesquida, HF Knapp, A Stemmer
    posted to charge writing by hearoplane on 2007-10-23 15:24:07 as **
  • Electrostatic forces in atomic force microscopy
    Physical Review B, Vol. 66, No. 3. (26 June 2002), 035402.
    by BM Law, F Rieutord
    posted to no-tag by hearoplane on 2007-10-18 11:09:12 as ** along with 1 person najhannoor
  • Atomic force microscopy modified for studying electric properties of thin films and crystals. Review
    Crystallography Reports, Vol. 49, No. 3. (30 May 2004), pp. 476-499.
    posted to kelvin kfm probe review by hearoplane on 2007-10-18 11:06:32 as ** along with 1 person najhannoor
  • On the importance of precise calibration techniques for an atomic force microscope
    Ultramicroscopy, Vol. 106, No. 4-5. (March 2006), pp. 413-422.
    posted to afm calibration laser by hearoplane on 2007-10-18 11:00:11 as **
  • Ionic and electronic impedance imaging using atomic force microscopy
    Journal of Applied Physics, Vol. 95, No. 12. (2004), pp. 8382-8392.
    by Ryan O'Hayre, Minhwan Lee, Fritz B Prinz
    posted to impedance by hearoplane on 2007-10-02 17:16:54 as **
  • Nanoscale Electromechanics of Ferroelectric and Biological Systems: A New Dimension in Scanning Probe Microscopy - Annual Review of Materials Research, 37(1):189 - Abstract
    posted to no-tag by hearoplane on 2007-09-06 16:31:41 as **
  • Integrated AFM-SECM in Tapping Mode: Simultaneous Topographical and Electrochemical Imaging of Enzyme Activity
    Angewandte Chemie International Edition, Vol. 42, No. 28. (2003), pp. 3238-3240.
    by Angelika Kueng, Christine Kranz, Alois Lugstein, Emmerich Bertagnolli, Boris Mizaikoff
    posted to no-tag by hearoplane on 2007-09-06 14:40:02 as **
  • Combined scanning electrochemical atomic force microscopy for tapping mode imaging
    Applied Physics Letters, Vol. 82, No. 10. (2003), pp. 1592-1594.
    posted to shielded tips by hearoplane on 2007-09-06 14:33:56 as **
  • Analysis of stray capacitance in the Kelvin method
    Review of Scientific Instruments, Vol. 62, No. 3. (1991), pp. 725-735.
    by ID Baikie, E Venderbosch, JA Meyer, PJZ Estrup
    posted to no-tag by hearoplane on 2007-07-25 11:15:37 as **
  • ac driving amplitude dependent systematic error in scanning Kelvin probe microscope measurements: Detection and correction
    Review of Scientific Instruments, Vol. 77, No. 4. (2006)
    by Yan Wu, Mark A Shannon
    posted to ac error kfm by hearoplane on 2007-07-25 11:13:40 as **
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