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these_morels Joubert [16 articles]

Nylige artikler sendt til these_morels bibliotek av forfatteren Joubert. Du kan også see everyone s Joubert.
  • Parallel angle resolved XPS investigations on 12 in. wafers for the study of W and WSix oxidation in air
    Microelectronic Engineering, Vol. 85, No. 9. (September 2008), pp. 1882-1887.
    posted to xps tungsten oxidation arxps by these_morel on 2008-09-19 08:41:13 as **
  • Design of notched gate processes in high density plasmas
    Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 20, No. 5. (2002), pp. 2024-2031.
    posted to passivation notching microloading by these_morel on 2008-09-18 14:41:27 as **
  • Enhancement of the recombination rate of Br atoms by CF[sub 4] addition and resist etching in HBr/Cl[sub 2]/O[sub 2] plasmas
    Journal of Applied Physics, Vol. 94, No. 10. (2003), pp. 6285-6290.
    by G Cunge, O Joubert, N Sadeghi
    posted to cleaning introduction by these_morel on 2008-07-11 15:12:45 as **
  • Nanometer scale linewidth control during etching of polysilicon gates in high-density plasmas
    Microelectronic Engineering, Vol. 69, No. 2-4. (September 2003), pp. 350-357.
    posted to introduction resist-trimming by these_morel on 2008-07-11 13:38:16 as **
  • X-ray photoelectron spectroscopy investigation of sidewall passivation films formed during gate etch processes
    Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 19, No. 2. (2001), pp. 420-426.
    posted to introduction passivation plasma by these_morel on 2008-07-10 15:32:30 as **
  • Polysilicon gate etching in high density plasmas. V. Comparison between quantitative chemical analysis of photoresist and oxide masked polysilicon gates etched in HBr/Cl[sub 2]/O[sub 2] plasmas
    Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 15, No. 1. (1997), pp. 88-97.
    by FH Bell, O Joubert
    posted to introduction passivation plasma by these_morel on 2008-07-10 15:31:39 as **
  • Plasma–wall interactions during silicon etching processes in high-density HBr/Cl2/O2 plasmas
    Plasma Sources Science and Technology, Vol. 14, No. 2. (2005), pp. S42-S52.
    posted to absorption cl2-o2 parois plasma by these_morel on 2008-03-05 09:11:32 as read
  • Poly-Si/TiN/HfO[sub 2] gate stack etching in high-density plasmas
    Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 25, No. 3. (2007), pp. 767-778.
    posted to effet-de-charge etching poly-si tin xps by these_morel on 2008-03-05 09:03:24 as read
  • Sub-0.1 mu m gate etch processes: Towards some limitations of the plasma technology?
    Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 18, No. 1. (2000), pp. 156-165.
    posted to oxidation recess silicon xps by these_morel on 2008-03-05 08:58:33 as read
  • Thin gate oxide behavior during plasma patterning of silicon gates
    Applied Physics Letters, Vol. 75, No. 8. (1999), pp. 1069-1070.
  • Monitoring chamber walls coating deposited during plasma processes: Application to silicon gate etch processes
    Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 22, No. 3. (2004), pp. 553-563.
    posted to floating_sample plasma xps by these_morel on 2007-10-08 14:47:12 as ****
  • notes New chamber walls conditioning and cleaning strategies to improve the stability of plasma processes
    Plasma Sources Science and Technology, Vol. 14 (2005), pp. 599-609.
    posted to parois xps by these_morel on 2007-08-03 10:36:20 as read along with 1 group LTM_LETI_etching
  • notes Ion flux composition in HBr/Cl[sub 2]/O[sub 2] and HBr/Cl[sub 2]/O[sub 2]/CF[sub 4] chemistries during silicon etching in industrial high-density plasmas
    Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 20, No. 5. (2002), pp. 2137-2148.
  • notes Etching characteristics of TiN used as hard mask in dielectric etch process
    Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 24, No. 5. (2006), pp. 2262-2270.
    posted to titane_nitride xps by these_morel on 2007-02-28 07:59:19 as read along with 1 group LTM_LETI_etching
  • notes Mass spectrometry studies of resist trimming processes in HBr/O[sub 2] and Cl[sub 2]/O[sub 2] chemistries
    Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 23, No. 1. (2005), pp. 103-112.
    by E Pargon, O Joubert, T Chevolleau, G Cunge, Songlin Xu, Thorsten Lill
  • Plasma etching of HfO[sub 2] at elevated temperatures in chlorine-based chemistry
    Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 24, No. 1. (2006), pp. 30-40.
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