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these_morels Wang [7 articles]

Nylige artikler sendt til these_morels bibliotek av forfatteren Wang. Du kan også see everyone s Wang.
  • Molybdenum metal gate MOS technology for post-SiO<sub>2</sub> gate dielectrics
    Electron Devices Meeting, 2000. IEDM Technical Digest. International (2000), pp. 641-644.
    by Qiang Lu, R Lin, P Ranade, Yee C Yeo, Xiaofan Meng, H Takeuchi, Tsu-Jae King, Chenming Hu, Hongfa Luan, Songjoo Lee, Weiping Bai, Choong-Ho Lee, Dim-Lee Kwong, Xin Guo, Xiewen Wang, Tso-Ping Ma
    posted to dual-metal-gate metal-gate molybdenum nitrogen by these_morel on 2008-05-21 12:01:46 as **
  • Thermal decomposition mechanisms of tungsten nitride CVD precursors on Cu(1 1 1)
    Surface Science, Vol. 600, No. 3. (1 February 2006), pp. 743-754.
    by Yaw-Wen Yang, Jin-Bao Wu, Jelin Wang, Yi-Feng Lin, Hsin-Tien Chiu
  • notes Novel dual-metal gate technology using Mo-MoSi/sub x/ combination
    Electron Devices, IEEE Transactions on, Vol. 53, No. 6. (2006), pp. 1420-1426.
    by Tzung-Lin Li, Wu-Lin Ho, Hung-Bin Chen, HCH Wang, Chun-Yen Chang, Chenming Hu
  • notes The effect of nitrogen ion implantation on tungsten surfaces
    Applied Surface Science, Vol. 150, No. 1-4. (11 August 1999), pp. 34-38.
    by HL Zhang, DZ Wang, NK Huang
    posted to tungsten-nitride xps by these_morel on 2006-12-13 15:58:04 as read along with 1 group LTM_LETI_etching
  • notes Effects of experimental parameters on NF3 decomposition fraction in an oxygen-based RF plasma environment
    Chemosphere, Vol. 57, No. 9. (December 2004), pp. 1157-1163.
    by Ya-Fen Wang, Lin-Chi Wang, Minliang Shih, Cheng-Hsien Tsai
    posted to decomposition nf3 nf3-o2 by these_morel on 2006-06-19 10:10:08 as read along with 1 group LTM_LETI_etching
  • notes Evaluation of the effectiveness of H[sub 2] plasmas in removing boron from Si after etching of HfO[sub 2] films in BCl[sub 3] plasmas
    Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 23, No. 2. (2005), pp. 547-553.
    by C Wang, VM Donnelly
    posted to bcl3 etching hfo2 plasma by these_morel on 2006-02-17 15:28:10 as read along with 1 group LTM_LETI_etching
  • notes Investigation of etching properties of HfO based high-K dielectrics using inductively coupled plasma
    Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 22, No. 4. (2004), pp. 1552-1558.
    by Jinghao Chen, Won J Yoo, Zerlinda YL Tan, Yingqian Wang, Daniel SH Chan
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