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these_morels dielectric [9 articles]

Artikler nylig sendt til these_morels bibliotek klassifisert med nøkkelordet dielectric. You can also see everyone's dielectric.
  • Plasma etching of HfO[sub 2] at elevated temperatures in chlorine-based chemistry
    Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 24, No. 1. (2006), pp. 30-40.
  • Etching of high-k dielectric Zr[sub 1 - x]Al[sub x]O[sub y] films in chlorine-containing plasmas
    The 47th international symposium: Vacuum, thin films, surfaces/interfaces, and processing NAN06, Vol. 19, No. 4. (2001), pp. 1361-1366.
    by K Pelhos, VM Donnelly, A Kornblit, ML Green, RB Van Dover, L Manchanda, Y Hu, M Morris, E Bower
  • Ion-enhanced chemical etching of HfO[sub 2] for integration in metal--oxide--semiconductor field effect transistors
    Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 21, No. 6. (2003), pp. 2420-2427.
    by Lin Sha, Ragesh Puthenkovilakam, You S Lin, Jane P Chang
    posted to dielectric hfo2 high-k by these_morel on 2006-02-21 09:36:28 as ** along with 1 group LTM_LETI_etching
  • Etch characteristics of HfO2 films on Si substrates
    Applied Surface Science, Vol. 187, No. 1-2. (14 February 2002), pp. 75-81.
    by S Norasetthekul, PY Park, KH Baik, KP Lee, JH Shin, BS Jeong, V Shishodia, DP Norton, SJ Pearton
    posted to dielectric hfo2 high-k by these_morel on 2006-02-21 09:28:42 as ** along with 1 group LTM_LETI_etching
  • Hafnium and zirconium silicates for advanced gate dielectrics
    Journal of Applied Physics, Vol. 87, No. 1. (2000), pp. 484-492.
    by GD Wilk, RM Wallace, JM Anthony
    posted to dielectric high-k by these_morel on 2006-02-21 09:01:27 as ** along with 1 group LTM_LETI_etching
  • notes Integration of Dual Metal Gate CMOS on High-k Dielectrics Utilizing a Metal Wet Etch Process
    Electrochemical and Solid-State Letters, Vol. 8, No. 10. (2005), pp. G271-G274.
    by Zhibo Zhang, SC Song, Craig Huffman, Muhammad M Hussain, Joel Barnett, Naim Moumen, Husam N Alshareef, Prashant Majhi, Johnny H Sim, Sang H Bae, Byoung H Lee
  • notes Effect of hydrogen peroxide on hydrofluoric acid etching of high-k materials: ESR investigations
    Journal of Non-Crystalline Solids, Vol. 351, No. 18. (15 June 2005), pp. 1559-1564.
  • Effects of Nitrogen Additive Gas on Sidewall Passivation in W/TiN/High-k Dielectric Gate Etching
    Microprocesses and Nanotechnology Conference, 2000 International (2000), pp. 210-211.
    by Jae-Young Kim, Yu-Kwon Kim, Kwang-Ok Kim, Chang J Choi, Jin W Kim
  • Metal gate technology for nanoscale transistors--material selection and process integration issues
    Thin Solid Films, Vol. 462-463 (September 2004), pp. 34-41.
    by Yee-Chia Yeo
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