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these_morels microelectronics [11 articles]

Artikler nylig sendt til these_morels bibliotek klassifisert med nøkkelordet microelectronics. You can also see everyone's microelectronics.
  • Transistor MOS et sa technologie de fabrication
    Technique de l'ingénieur, No. E2430. (February 2000)
    by Thomas Skotnicki
    posted to microelectronics introduction cmos by these_morel on 2008-07-10 13:36:06 as **
  • Physics of Semiconductor Devices
    (04 November 1981)
    by Simon M Sze
    posted to microelectronics introduction cmos by these_morel on 2008-07-10 13:28:17 as ** along with 1 person kristgy
  • Accurate determination of ultrathin gate oxide thickness and effective polysilicon doping of CMOS devices
    Electron Device Letters, IEEE, Vol. 18, No. 12. (1997), pp. 580-582.
    by A Gupta, Peng Fang, M Song, Ming-Ren Lin, D Wollesen, K Chen, C Hu
    posted to polydepletion microelectronics introduction by these_morel on 2008-05-16 12:55:02 as **
  • Polysilicon gate depletion effect on IC performance
    Solid-State Electronics, Vol. 38, No. 11. (November 1995), pp. 1975-1977.
    by Kai Chen, Mansun Chan, Ping K Ko, Chenming Hu, Jian-Hui Huang
    posted to polydepletion microelectronics introduction by these_morel on 2008-05-16 08:06:41 as **
  • Anomalous C-V characteristics of implanted polyMOS structure in n+/p+ dual-gate CMOS technology
    Electron Device Letters, IEEE, Vol. 10, No. 5. (1989), pp. 192-194.
    by CY Lu, JM Sung, HC Kirsch, SJ Hillenius, TE Smith, L Manchanda
    posted to polydepletion microelectronics introduction by these_morel on 2008-05-16 07:55:26 as **
  • Gate oxide scaling limits and projection
    Electron Devices Meeting, 1996., International (1996), pp. 319-322.
    by Chenming Hu
    posted to tunneling polydepletion microelectronics introduction eot by these_morel on 2008-05-15 15:45:00 as **
  • Gate length dependent polysilicon depletion effects
    Electron Device Letters, IEEE, Vol. 23, No. 4. (2002), pp. 224-226.
    by Chang-Hoon Choi, PR Chidambaram, R Khamankar, CF Machala, Zhiping Yu, RW Dutton
    posted to polydepletion microelectronics introduction by these_morel on 2008-05-15 15:35:15 as **
  • Device scaling limits of Si MOSFETs and their application dependencies
    Proceedings of the IEEE, Vol. 89, No. 3. (2001), pp. 259-288.
    by DJ Frank, RH Dennard, E Nowak, PM Solomon, Y Taur, Hon-Sum P Wong
    posted to tunneling microelectronics introduction by these_morel on 2008-05-15 13:27:43 as **
  • 3D Integration of CMOS transistors with ICV-SLID technology
    Microelectronic Engineering, Vol. 82, No. 3-4. (December 2005), pp. 529-533.
    by Robert Wieland, Detlef Bonfert, Armin Klumpp, Reinhard Merkel, Lars Nebrich, Josef Weber, Peter Ramm
    posted to microelectronics cmos 3d-integration by these_morel on 2008-05-14 11:38:36 as **
  • Cramming More Components Onto Integrated Circuits
    Proceedings of the IEEE, Vol. 86, No. 1. (1998), pp. 82-85.
    by GE Moore
  • Insulated gate field effect transistor integrated circuits with silicon gates
    Electron Devices, IEEE Transactions on, Vol. 16, No. 2. (1969), pp. 236-236.
    by F Faggin, T Klein, L Vadasz
    posted to microelectronics introduction by these_morel on 2008-04-28 13:29:56 as read
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